ZEISS CONTURA
A versatile coordinate measuring machine for demanding dimensional inspection, combining tactile and optical measurement capabilities on a flexible platform.
One CMM platform for changing measurement requirements.
Manufacturing inspection rarely stays limited to one type of feature. A single component may require tactile measurement for geometric features, scanning for contours and optical measurement for selected surfaces.
ZEISS CONTURA is designed around this changing measurement environment. Its ZEISS mass technology provides a common interface for a broad range of tactile and optical sensors, allowing the machine to adapt as inspection requirements change.
When one inspection method is not enough.
Modern manufactured components can combine geometric features, freeform surfaces, small details and different inspection requirements. CONTURA is designed to support these different measurement tasks from one platform.
Mixed measurement requirements
Components may require tactile probing for dimensions and geometry while other features benefit from optical measurement. A multisensor CMM reduces the need to move the part between separate measurement systems.
Increasing inspection complexity
As components become more complex, inspection plans can involve multiple sensors, different probing strategies and more detailed dimensional requirements.
Changing production requirements
A measurement system needs to remain useful when part sizes, inspection tasks and production conditions change. CONTURA provides a configurable platform that can evolve with those requirements.
Built to adapt as your inspection workflow changes.
CONTURA is designed as a flexible coordinate measuring platform rather than a single-purpose inspection machine. The system supports a broad range of sensor technologies through ZEISS mass technology.
Common sensor interface
Switch between compatible ZEISS sensor technologies on the same measuring platform for different inspection requirements.
Tactile and optical measurement
Support contact measurement alongside optical inspection using compatible ZEISS sensor configurations.
Configurable measuring volume
CONTURA is available in multiple sizes to accommodate different workpiece dimensions and inspection requirements.
Designed for future requirements
Options including rotary-table measurement, automated probe changing and HTG help extend the machine’s application range.
Choose the sensor technology around the part.
CONTURA supports a wide range of ZEISS sensors, giving measurement teams more flexibility when inspection tasks move beyond conventional tactile probing.
Tactile Measurement
Use contact-based probing for dimensional features, geometric tolerances, datums, bores, planes and other discrete characteristics that require coordinate measurement.
Optical Measurement
Optical sensor options extend CONTURA into non-contact measurement tasks where surfaces, edges or features are better suited to optical acquisition.
Multisensor Workflows
Combine different measurement technologies within one CMM environment to address components with varied dimensional and surface inspection requirements.
ZEISS LineScan
Compatible optical scanning configurations can extend CONTURA towards non-contact acquisition and four-axis measurement when combined with the appropriate rotary table configuration.
ZEISS VAST
ZEISS VAST probe technologies support tactile measurement and scanning workflows where high-density measurement data is required.
ZEISS DotScan
Optical sensor options such as ZEISS DotScan provide non-contact measurement capabilities for suitable surfaces and applications.
One interface. Multiple measurement technologies.
ZEISS mass technology is central to CONTURA’s flexibility, allowing a broad range of compatible sensors to be operated on the same measuring machine.
Change sensor configurations
Use different ZEISS sensor configurations for different workpiece geometries and inspection tasks without requiring a separate CMM platform.
Reach different feature types
Select tactile or optical measurement technologies according to the geometry, surface and accessibility of the feature being inspected.
Adapt the system over time
A configurable sensor architecture helps the CMM remain relevant as inspection requirements develop and new measurement tasks are introduced.
CONTURA across precision manufacturing.
From machined components to plastics, electronics and medical parts, CONTURA can support dimensional inspection where repeatable coordinate measurement is required.
Dimensional & GD&T Inspection
Measure critical dimensions, datums, geometric relationships and GD&T characteristics on precision machined components.
Moulded Component Inspection
Verify dimensions and geometric characteristics on moulded components, tooling and production parts where repeatable dimensional inspection is required.
Medical Component Measurement
Support dimensional verification of manufactured medical components and instruments where consistent measurement and traceability are important.
Small & Complex Components
Inspect small and complex manufactured components using appropriate tactile or optical sensor configurations.
From measurement requirement to documented result.
A CMM inspection workflow combines part setup, sensor selection, measurement planning and evaluation. CONTURA works within this process through the ZEISS CALYPSO software environment.
Define the inspection requirement
Identify the critical dimensions, datums, tolerances and features that need to be verified.
Select the measurement strategy
Choose an appropriate tactile or optical sensor configuration based on the component and features.
Measure the component
Execute the inspection programme using the configured CONTURA measurement system and sensor technology.
Evaluate & report
Evaluate measured characteristics in ZEISS CALYPSO and produce documented inspection results.
ZEISS CONTURA specifications.
The exact configuration depends on machine size, sensor selection and application requirements.
| Measuring volume | Various sizes from X 7–12 dm, Y 7–24 dm and Z 6–10 dm |
| Accuracy from | 1.4 + L/350 µm |
| Sensor technology | Broad range of tactile and optical sensors enabled by ZEISS mass technology |
| Compatible probes | ZEISS VAST XT gold, ZEISS VAST XTR gold, ZEISS RDS, ZEISS VAST XXT, ZEISS XDT, ZEISS DotScan, ZEISS ViScan, ZEISS LineScan and ZEISS direct VAST XXT |
| Maximum workpiece weight | Approximately 730–1,200 kg depending on machine size |
| Software | ZEISS CALYPSO |
ZEISS CALYPSO for coordinate measurement.
ZEISS CALYPSO provides the software environment for creating and executing CMM measurement plans and evaluating standard geometries.
Using CONTURA with ZEISS CALYPSO provides a connected workflow from measurement planning through to documented dimensional inspection results.
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Selecting a CMM involves more than comparing machine dimensions. Part geometry, tolerance requirements, sensor technology, inspection volume, environment and future measurement needs all affect the right configuration.
Global TechSolutions can help manufacturers evaluate their inspection requirements and explore the appropriate ZEISS CMM configuration.
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